Name of the equipment: Atomic Force Microscope Make & Model: PARK SYSTEMS PARK XE-100, H077600327 I-Stem Registration ID- 3213535 Category of Instrument Characterization and Testing Types of Analysis / Testing Characterization Application: 1. Topography analysis in Electronic Industry 2. Polymers/Biological sample application 3. Piezo electric Description of Instrument Used to obtain an infrared spectrum of absorption or emission of solid, liquid or gas

Book through I-STEM: https://www.istem.gov.in/ Slot Booking Link I-STEM Slot Booking link for External User

Booking available for Internal and External Both Requisition form for Internal External

Faculty In-charge: Dr. Soney Varghese Email ID: soneyva@nitc.ac.in Phone number:  +91-9446273684

Technical Staff: Gaurav Pandey gauravpandey@nitc.ac.in

Department MSED Office Email ID msedoffice@nitc.ac.in Location Room No. 204B, Department of Materials Science and Engineering Lab Phone No 0495-2286501

Features of the equipment Ø Atomic Force Microscopy (AFM) is a powerful technique for imaging surfaces at the nanoscale. Its key features include high resolution, the ability to image in various environments, and versatility in characterizing both topography and material properties	Unique features/Measurement capabilities, if any
Instrument Technical Description and Major Specifications (This Specifications Limited to Major 5) 1. To identify Topography 2. To identify I/V Spectroscopy 3. To identify F-D Spectroscopy 4. To identify Nano Indentation	Measurement/Sample specifications: · Maximum Size · 2cm×2cm Film/Coated samples · No Liquid/Powder samples

Ø Login to the ISTEM portal and book the slot.

Ø Samples can be sent in the address,

Department of Materials Science and Engineering,

NIT Calicut,

NIT Campus PO-673601

                  Calicut, Kerala.

Internal	External Academic Institutes	National R&D Lab	Industry
200	1000	1000	2000